Electrostatic force microscope for probing surface charges in aqueous solutions.

نویسندگان

  • S Xu
  • M F Arnsdorf
چکیده

A scanning force microscope was converted to an electrostatic force microscope by charging the usually neutral cantilever with phospholipids. The electrostatic force microscope was used to study surface electrostatic charges of samples in aqueous solutions. Lysozymes, DEAE-Sephadex beads, 3-propyltriethoxysilane-treated glass and mica were imaged in water or phosphate buffer with electrostatic force microscopy. The adhesion force measured when a charged probe and oppositely charged specimen interacted was up to 500 times greater than when a bare probe was used. This dramatic increase in measured adhesion force can be attributed to the energy required to break the salt bridges formed between the charged probe and the specimen. The use of phospholipids to functionalize the cantilever tip allows the incorporation of other biomolecules and ligands that can be used as biologically specific tips (e.g., receptors, drugs) for the study of intermolecular interactions.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Nanoscale Roughness and Morphology Affect the IsoElectric Point of Titania Surfaces

We report on the systematic investigation of the role of surface nanoscale roughness and morphology on the charging behaviour of nanostructured titania (TiO2) surfaces in aqueous solutions. IsoElectric Points (IEPs) of surfaces have been characterized by direct measurement of the electrostatic double layer interactions between titania surfaces and the micrometer-sized spherical silica probe of ...

متن کامل

In Situ Monitoring of Kinetics of Charged Thiol Adsorption on Gold Using an Atomic Force Microscope

The adsorption of a charged thiol (HSC10COO) on gold from its aqueous solutions of different concentration was monitored in situ by probing the surface charge. This was accomplished by measuring the interfacial forces between a modified (with a negatively charged silica sphere) tip of an atomic force microscope and the thiol-adsorbed gold surface as a function of adsorption time. The surface ch...

متن کامل

The influence of discrete surface charges on the force between charged surfaces.

The force between two parallel charged flat surfaces, with discrete surface charges, has been calculated with Monte Carlo simulations for different values of the electrostatic coupling. For low electrostatic coupling (small counterion valence, small surface charge, high dielectric constant, and high temperature) the total force is dominated by the entropic contribution and can be described by m...

متن کامل

Dispersive charge transport along the surface of an insu - lating layer observed by Electrostatic Force Microscopy

– We report the observation in the direct space of the transport of a few thousand charges submitted to a tunable electric field along the surface of a silicon oxide layer. Charges are both deposited and observed using the same Electrostatic Force Microscope. During the time range accessible to our measurements (i.e. t = 1 ∼ 1000 s), the transport of electrons is mediated by traps in the oxide....

متن کامل

Monitoring Multilayer Film Growth with the Atomic Force Microscope. Aluminum(III) Alkanebisphosphonate Multilayer Films and DNA Immobilization

The growth of aluminum(III) alkanebisphosphonate multilayer thin films on gold surfaces in aqueous solutions was investigated by probing the surface charge following alternate treatments with anionic phosphonate and cationic Al(III). This was accomplished by determining the force between a modified silica tip of an atomic force microscope (AFM) and the film-covered gold substrate. The AFM force...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Proceedings of the National Academy of Sciences of the United States of America

دوره 92 22  شماره 

صفحات  -

تاریخ انتشار 1995